Hi-fines ray analyzer LWA-1k Series for frequency noise, linear measurement and analysis of narrow line width light sources-LWA-1K 780
Hi-fines ray analyzer LWA-1k Series for frequency noise, linear measurement and analysis of narrow line width light sources-TOPTICA Photonics AG

Hi-fines ray analyzer LWA-1k Series for frequency noise, linear measurement and analysis of narrow line width light sources
TOPTICA Photonics AG


About This Product

■ Characteristics ・ Time trace measurement of frequency deviation ・ Frequency noise dense spectrum ・ Strength noise spectrum ・ Laser linear spectrum It is a solid and compact device that can be used for multiple purposes, for the purpose of measuring, analyzing and controling laser frequencies and intensity noise. It is an ideal device for measuring precision laser characteristics in real time. The highest sensitivity is achieved by the connection between the operation principle of the interferometer and the high -end optical and electrical components. Based on the calculation of frequency deflection, the frequency noise dense spectrum, the essential (LORENTZIAN) line width up to 350Hz, and the optical linear and relative strength noise by evaluating the validity (optical) line (optical) line. Rin) enables measurement. A lot of additional information can be obtained by further analysis. The fair measurement, which is the principle of LWA, is superior to the optical delay line technology, and the latter method that relys on non -clear evaluation is due to lack of technology. LWA can reduce laser line width using PID control. ■ Equipment that enables measurement up to a very narrow line width ・ Lin width stenosis, PID control ・ Vase is frequency separation (interference meter)

  • Product

    Hi-fines ray analyzer LWA-1k Series for frequency noise, linear measurement and analysis of narrow line width light sources




*Please note that we may not be able to accommodate sample requests.

4 Models of Hi-fines ray analyzer LWA-1k Series for frequency noise, linear measurement and analysis of narrow line width light sources

Items marked with have different values ​​depending on the model number.

Click on the part number for more information about each product

Product Image Part Number Price (excluding tax) Effective line width range Frequency noise band width Frequency noise density Noise floor (Hz/√hz) Optical & Lorentz line width Specific line range range Wavelength range (NM)
Hi-fines ray analyzer LWA-1k Series for frequency noise, linear measurement and analysis of narrow line width light sources-Part Number-LWA-1K 780

LWA-1K 780

Available upon quote <10kHz-20MHz 10Hz-10MHz 50Hz-10MHz 25-500 350Hz-20MHz <8kHz 760-1,064
Hi-fines ray analyzer LWA-1k Series for frequency noise, linear measurement and analysis of narrow line width light sources-Part Number-LWA-1K 1550

LWA-1K 1550

Available upon quote <1kHz-20MHz 10Hz-10MHz 50Hz-10MHz 5-100 350Hz-20MHz <350Hz 1,530-1,565
Hi-fines ray analyzer LWA-1k Series for frequency noise, linear measurement and analysis of narrow line width light sources-Part Number-LWA-100k NIR

LWA-100k NIR

Available upon quote <10kHz-20MHz 25Hz-10MHz 25Hz-10MHz 25-1,000 2kHz-20MHz <2kHz 1,064-1,625
Hi-fines ray analyzer LWA-1k Series for frequency noise, linear measurement and analysis of narrow line width light sources-Part Number-LWA-100K Vis

LWA-100K Vis

Available upon quote - - 25Hz-10MHz - 2kHz-20MHz - -

Click on the part number for more information about each product

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About Company Handling This Product

TOPTICA Photonics AG

  • Germany
  • Since 1998
  • 490 employees

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