Hi-fines ray analyzer LWA-1k Series for frequency noise, linear measurement and analysis of narrow line width light sources-TOPTICA Photonics AG

LWA-100K Vis | Hi-fines ray analyzer LWA-1k Series for frequency noise, linear measurement and analysis of narrow line width light sources
TOPTICA Photonics AG


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Effective line width range

Frequency noise band width

Frequency noise density

Noise floor (Hz/√hz)

Optical & Lorentz line width

Specific line range range

Wavelength range (NM)

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  • Part Number

    LWA-100K Vis




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Hi-fines ray analyzer LWA-1k Series for frequency noise, linear measurement and analysis of narrow line width light sources LWA-100K Vis's performance table

Items marked with have different values ​​depending on the model number.

Product Image Price (excluding tax) Frequency noise density Optical & Lorentz line width
Hi-fines ray analyzer LWA-1k Series for frequency noise, linear measurement and analysis of narrow line width light sources-Part Number-LWA-100K Vis Available upon quote 25Hz-10MHz 2kHz-20MHz

There are 4 models for this product.

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About Company Handling This Product

TOPTICA Photonics AG

  • Germany
  • Since 1998
  • 490 employees

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