Product
Semiconductor crystal sapphire wafer-window / substrateHandling Company
Tours Co., Ltd.Product Image | Part Number | Price (excluding tax) | Appeared elastic limit | Crossing rate | Crystal lattice constant | Crystal structure | DN/DT DN/DU = 0 | Expenditure rate | Heat expansion coefficient | Melting point | Morse hardness | Optical uniformity | Permeation range | Poisson ratio | Reflection loss | Refractive index | Thermal conductivity | Volume elasticity rate | Young's modulus | density | specific heat |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
AL2O3 (SAPPHIRE) |
Available upon quote | 275GPA | 148.1GPa | a = b = 4.758 å, c = 12.991å | Hexagonal |
13.7x10⁻⁶AT5.4um 1.5um (DN/DT DN/DT = 0:00) |
C axis parallel 11.5 (1MHz) |
C axis parallel 5.6x10⁻⁶K C Axial vertical 5.0x10⁻⁶/K |
2,040 ° C | 9 | ΔN <10⁻⁶/cm> | 180 ~ 5,500Nm | 0.25 | 11.7% of Jin light, abnormal light 14.2% (1.06UM double -sided) | No1.75449, NE1.74663 (1.06um) | 27.21W/ (MXK) AT300K (20 ℃) | 240GPA | 335GPA | 20 ℃/9.71W M/K | 419JKG⁻¹K⁻¹⁻¹ |