CW/Pulse i-L tester SEC-7000 | Intellectual credit semiconductor laser characteristic evaluation device series
System Giken Co., Ltd.
Price (excluding tax)
Model Description
A device that drives the LD CW ~ Pulse and measures the I-L and i-VF characteristics. This system is a device that measures the I-L and i-VF characteristics by CW and pulse driven by laser diodes. ■ Product features ・ The kink characteristics of I-L in pulse modulation that cannot be obtained by CW drive can be measured to the area of the short pulse width. ・ It is a versatile type system that corresponds to double -poles. ・ The obtained data is displayed on Windows and the data is processed.
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Target device
wavelength
Drive ability
Drive system
Interface
Pulse settings decomposition ability
Synchronization
pulse width
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Part Number
CW/Pulse i-L tester SEC-7000
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Handling Company
System Giken Co., Ltd.
Intellectual credit semiconductor laser characteristic evaluation device series CW/Pulse i-L tester SEC-7000's performance table
Items marked with have different values depending on the model number.
| Product Image | Price (excluding tax) | Drive ability | Drive system | Pulse settings decomposition ability | Synchronization | pulse width |
|---|---|---|---|---|---|---|
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Available upon quote | 0 ± 250mA/± 7.5Vmax, 0 ± 500mA/± 7.5Vmax | CW/Pulse ACC | 100nsec | 1μs ~ 1.6ms | 0 ~ ± 1A 0 ~ ± 5V |
There are 4 models for this product.
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About Company Handling This Product
- Japan
- Since 1968
- 30 employees