Intellectual credit semiconductor laser characteristic evaluation device series-System Giken Co., Ltd.

CAN_LD 320ch temperature/DC characteristic automatic evaluation device | Intellectual credit semiconductor laser characteristic evaluation device series
System Giken Co., Ltd.


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Model Description

This device automatically measures the light emission characteristics (i-L, λ, etc.) of the CAN type LD at an arbitrary temperature of -40 to 85 ° C. A cold -heat block type that combines a freezer and a heater has been adopted, and it has achieved higher throughput and reliability compared to the conventional 160ch perchae type. We assume that it can contribute to the creation of added value of users who supply devices to the booming FTTH market. ■ Product overview ・ Measurement :: I -L characteristics and λ characteristics continuous measurement (3 temperature) ・ Temperature variable range: -40 to 85 ° C (maximum temperature level movement time about 25min) ・ Average measurement tact time: 15sec/1 element/1 temperature 40min/160 element/1 temperature ・ Maximum processing ability: 6,400 elements (80HR unmanned continuous operation)


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    CAN_LD 320ch temperature/DC characteristic automatic evaluation device




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Intellectual credit semiconductor laser characteristic evaluation device series CAN_LD 320ch temperature/DC characteristic automatic evaluation device's performance table

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Product Image Price (excluding tax) Target device wavelength
Intellectual credit semiconductor laser characteristic evaluation device series-Part Number-CAN_LD 320ch temperature/DC characteristic automatic evaluation device Available upon quote φ3.8, 5.6 Can LD 405 ~ 900Nm, 1,100 ~ 1,550nm

There are 4 models for this product.

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About Company Handling This Product

System Giken Co., Ltd.

  • Japan
  • Since 1968
  • 30 employees

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