The highest class in the folds and the highest class nano structural analysis high resolution SAXS and XRD vacuum chamber Module-EVAC module
The highest class in the folds and the highest class nano structural analysis high resolution SAXS and XRD vacuum chamber Module-Anton Paar GmbH

The highest class in the folds and the highest class nano structural analysis high resolution SAXS and XRD vacuum chamber Module
Anton Paar GmbH


About This Product

■ Features ・ Excellent S/N ratio by completely vacuumed beam pass ・ Saxs optical system that can be measured by the quality of the standalone SAXS dedicated machine ・ It is suitable for high -solutioning XRD measurement of reflection method or transparent method. ・ Measurement without receiving the 2θ range restrictions ■ The highest class analysis of the highest class in folds ・ By combining EVAC module and XRDynamic 500, the quality of the line collection SAXS dedicated machine was brought to the first time. -If you use it in combination with an optimized SAXS optical system that does not scatter the EVAC module scattered slits, you can achieve the resolution of QMIN = 0.05nm⁻¹ and set a new standard for SAXS measurement on the XRD platform. EVAC modules and XRDynamic 500 have made SAXS measurements of integrity samples, colloid distributors, and biological samples very easier. ■ Very excellent data quality without parasitic air scattering In a completely vacuumed beam path, which was realized by the EVAC module and XRDynamic 500 vacuum optical unit, all air scattering is removed, the best S/N ratio as possible is realized. Masu. This improves X -ray strength in all measurements, especially when handling low -energy X -rays such as CR Kα and Co Kα. ■ No limit measurement for SAXS, WAXS, XRD, PDF analysis ・ EVAC modules do not limit the measurement method in any measurement of SAXS, XRD, and PDF. Everything is possible, such as reflection and transparency measurement, powdered sample carrier and capillary. -There is a unique function in which the EVAC module rotates with the second Rigonio meter arm, there is no limit to the measurement angle and the data from 0 ° to 162.5 ° 2θ can be measured seamlessly at once. ■ Compatible device Fully automatic multipurpose X -ray diffraction device: XRDynamic 500

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    The highest class in the folds and the highest class nano structural analysis high resolution SAXS and XRD vacuum chamber Module




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1 Models of The highest class in the folds and the highest class nano structural analysis high resolution SAXS and XRD vacuum chamber Module

Product Image Part Number Price (excluding tax) Measurement range QMIN Sample holder
The highest class in the folds and the highest class nano structural analysis high resolution SAXS and XRD vacuum chamber Module-Part Number-EVAC module

EVAC module

Available upon quote -10 ° ̶ 162.5 ° 2theta 0.05 ・ All XRD sample holders of standard dimensions
・ Swaxs Sample holder for liquid
・ Swaxs solid sample holder
・ Swaxs Sample holder for disposable capture capture
·other

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