Near Field Prove 1GHz ~ 20GHz SX-R 20-1
Wave Crest
About This Product
■ Characteristics
・ The SX-R 20-1 set is composed of a passive named field probe to measure high-frequency magnetic fields up to 20 GHz during the development period.
-If you use the probe head of SX-R 20-1, you can measure near the electronic assembly, such as individual IC pin, conductors, parts, and connection portions, to identify the interference source.
・ By properly guiding the near field probe, you can determine the direction and distribution of the field on the electronic assembly.
・ Near field probe is small and convenient. There is a decay of shies current and is electrically shielded.
・ Near field probe is used by connecting to the spectrum analyzer or oscilloscope for 50Ω input.
■ Set contents
・ 1x SX-R 20-1, H field probe 1 GHz ~ 20 GHz
・ 1X SMA-SMA 1 M ES, measuring cable with SMA-SMA shield
・ 1X case 4, system case, near field probe
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Product
Near Field Prove 1GHz ~ 20GHz SX-R 20-1
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Handling Company
Wave Crest
1 Models of Near Field Prove 1GHz ~ 20GHz SX-R 20-1
| Product Image | Part Number | Price (excluding tax) | Connector-Output | Frequency range | Probe head dimensions |
|---|---|---|---|---|---|
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SX-R 20-1 set |
Available upon quote | SMA, female, jack | 1 GHz ... 20 GHz | ≈6x6mm |
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