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  2. Ideal for polishing the front of ion milling ultra -precision dating grinder MODEL 200 (Musashino Denshi, INC.)


Ideal for polishing the front of ion milling ultra -precision dating grinder MODEL 200-Model 200
Ideal for polishing the front of ion milling ultra -precision dating grinder MODEL 200-Musashino Denshi, INC.

Ideal for polishing the front of ion milling ultra -precision dating grinder MODEL 200
Musashino Denshi, INC.

About This Product

It is a mechanical polishing device for producing a thin piece sample for transmitted electron microscope (TEM). Ideal for using an ion milling device as the final stage of sample making. ■ Characteristics ・ Ideal for polishing in front of ion milling ・ Automatically control grinding rate ・ Outstanding final finish polishing accuracy (± 1 μm) ・ Automatically control polishing work due to built -in microcessor ・ A 40 -fold microscope can be observed during sample positioning and sample creation. ・ Because it is rich in polishing tools, it is possible to polish esoteric materials. ・ Wide dimple and flat polishing are possible ・ Displays the sample thickness during processing in the LCD panel in real time ・ Built -in automatic stopping mechanism after reaching the final sample thickness ・ We can polish all materials and have a wide selection of polishing tools (wheels) to support large samples (<5mm). ・ Grinding rate Automatically control function The grinding pin is automatically descended according to the hardness of the material to be polished, so it does not damage the sample. ・ Polishing with a timer is also possible. In this case, the rotation speed of the polishing wheel and the downward speed of the grinding pin are automatically adjusted according to the set time. ・ At the time of polishing, the polishing wheel is automatically increased by 250 μm to finish the polishing by automatically increasing the polishing wheel so that the sample is not damaged. ・ It is possible to shorten the time for ionizing by reducing the sample to some extent with the damping grinder. E.A. Fiscency Instruments, Inc. device, which builds a sample using conventional technologies such as dimming polishing, ultrasonic disccuts, and producing a sample without damage from the concentrated ion beam. 。 Also, by removing only organic substances from the sample and holder from the sample and holder, the optimal environment for TEM and SEM electron microscope observation is realized by removing only organic substances.

  • Product

    Ideal for polishing the front of ion milling ultra -precision dating grinder MODEL 200



*Please note that we may not be able to accommodate sample requests.

1 Models of Ideal for polishing the front of ion milling ultra -precision dating grinder MODEL 200

Product Image Part Number Price (excluding tax) Body dimensions Body weight Grinding control Operation board Workstage power supply
Ideal for polishing the front of ion milling ultra -precision dating grinder MODEL 200-Part Number-Model 200

Model 200

Available upon quote W208mm x D165mm x H343mm 8.2kg Automatic grinding speed control
Grinding power control by counter weight
Independent control of whetstones and samples
Whetstone rotation speed control 		Keepad input (LCD screen) Fixed sample by magnet
High accuracy θ stage 		110/220 V AC, 50/60 Hz, 375 W

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About Company Handling This Product

Musashino Denshi, INC.

  • Japan
  • Since 1977

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