Intellectual credit semiconductor laser characteristic evaluation device series-System Giken Co., Ltd.

Butterfly LD temperature characteristic test device | Intellectual credit semiconductor laser characteristic evaluation device series
System Giken Co., Ltd.


Price (excluding tax)

Estimate Required


Model Description

By adopting a pelchede stage, the electricity and optical characteristics of the butterfly module LD such as DFB-LD, FP-LD, pump laser, etc. are automatically measured on a highly stable cold plate. Ideal for shipping product devices.


Model Filter

You can search for other models from each index. The displayed value is the value of the currently selected part number.

Target device

wavelength

Drive ability

Drive system

Interface

Pulse settings decomposition ability

Synchronization

pulse width

See all 4 models in list
  • Part Number

    Butterfly LD temperature characteristic test device




*Please note that we may not be able to accommodate sample requests.

Intellectual credit semiconductor laser characteristic evaluation device series Butterfly LD temperature characteristic test device's performance table

Items marked with have different values ​​depending on the model number.

Product Image Price (excluding tax)
Intellectual credit semiconductor laser characteristic evaluation device series-Part Number-Butterfly LD temperature characteristic test device Available upon quote

There are 4 models for this product.

Other products of System Giken Co., Ltd.


View more products of System Giken Co., Ltd.

About Company Handling This Product

System Giken Co., Ltd.

  • Japan
  • Since 1968
  • 30 employees

This is the version of our website addressed to speakers of English in the United States. If you are a resident of another country, please select the appropriate version of Metoree for your country in the drop-down menu.

Copyright © 2024 Metoree