Make -up measurement system for etching manufacturing TOPAQ-TOPAQ
Make -up measurement system for etching manufacturing TOPAQ-OSCILLATEDRECALLTECHNOLOGY

Make -up measurement system for etching manufacturing TOPAQ
OSCILLATEDRECALLTECHNOLOGY


About This Product

feature 1) Measurement of A3 size hitting pressure distribution in 40 seconds. Rather than simple strip pressure measurement, the effective liquid pressure can be measured by the liquid flow when using multiple sprays. 2) Measurement range 7.2pci to 43,000pci 3) Resolution 25.4um ~ 254um 4) The measurement results can be visualized by the surface distribution of liquid pressure (2D and 3D), the statistical distribution of the liquid pressure intensity, the specified position specified, and the visualization of the liquid pressure distribution for each place by displaying the liquid pressure distribution display for each grid. 5) Self -weight 7.7kg

  • Product

    Make -up measurement system for etching manufacturing TOPAQ




*Please note that we may not be able to accommodate sample requests.

1 Models of Make -up measurement system for etching manufacturing TOPAQ

Product Image Part Number Price (excluding tax) Average measurement time Its own weight Measurement range PC interface Scanningmode light source power consumption power supply resolution
Make -up measurement system for etching manufacturing TOPAQ-Part Number-TOPAQ

TOPAQ

Available upon quote 40 seconds 7.7kg 27.5cm x 43.18cm USB 36bcolor Coldcathodelamp 49WATTS 100-240VAC 25.4 μm ~ 254μm

Other products of OSCILLATEDRECALLTECHNOLOGY


View more products of OSCILLATEDRECALLTECHNOLOGY

About Company Handling This Product

This is the version of our website addressed to speakers of English in the United States. If you are a resident of another country, please select the appropriate version of Metoree for your country in the drop-down menu.

Copyright © 2024 Metoree