Compact Atomic Force Microscope NaioAFM
Japan Quantum Design Co., Ltd.
About This Product
Nanosurf's NaioAFM is the ideal device for users who want to quickly and concisely measure surface topography in nanotechnology education at universities and vocational schools, research and development, or quality control sites. It is widely used around the world as an "All-in-one" AFM device that combines functionality and operability and can be used by anyone, anywhere.
Features
■Anyone can start measuring immediately
To use NaioAFM, simply connect the power and USB connector and launch the software. You can start measuring immediately anywhere. Replacing the cantilever is very easy. There is no need for subsequent laser alignment. The software also automatically tunes the Dynamic mode (AC mode).
Scanning begins when the cantilever is brought close to the sample. The software automatically takes care of everything needed before scanning (retuning, sample approach, sample plane tilt correction).
■User-friendly cantilever replacement
Anyone can easily replace the cantilever in a short time by using NaioAFM's unique "Flip-over" scan head and special replacement tool. Freed from the hassle of replacing cantilevers, which was a problem for AFM beginners.
■Easily find the object to be observed with the built-in optical camera
You can position the cantilever and sample intuitively using the included XY positioner while viewing the cantilever and sample from directly above the sample. Additionally, inexperienced beginners can avoid unexpected collisions between the cantilever and the sample by observing them from the side using the side view camera to get a sense of the distance, allowing them to approach the cantilever to the sample with confidence.
option
■Side view observation camera
Normally, you can observe by looking directly into the lens on the top of the device, but if you use this option, you will be able to set the camera, adjust the light, and shoot and record on your PC. (Another free USB port is required on the PC side)
■Optional measurement mode
Various measurement mode options are available. You can add them to the software at any time to suit your needs.
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Product
Compact Atomic Force Microscope NaioAFM
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Handling Company
Japan Quantum Design Co., Ltd.
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Categories
1 Models of Compact Atomic Force Microscope NaioAFM
| Product Image | Part Number | Price (excluding tax) |
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NaioAFM |
Available upon quote |
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