EMF measurement solution in a harsh environment optical probe, optical world sensor eoProbe
Wave Crest
About This Product
■ Characteristics
・ The KapteOS system has achieved innovative electric field measurements with electrical optical probes and high -end converters using the barker effect.
・ The measurement performance exceeds several MV / m, provides the most advanced functions in a very harsh environment such as the ultra -high bandwidth of 40 Hz to 100 + GHz and underwater.
■ Comprehensive measurement of electric field vector
・ The three components and phases of the electric vector electric field can be measured.
・ In addition, two types of probes, a vertical and horizontal type, can accurately identify and measure the three -axis vectors by using the Eosensor converter.
■ Non -invasive measurement
・ The active parts of the sensor that do not use metal parts (metal free) are basically crystal.
・ Since the measurement signal is sent by the laser in the optical fiber link, there are the following advantages.
・ The measured electric field, unlike the conventional antenna -based probe, does not affect the measurement.
・ The probe and converter may be up to 100m away.
・ Especially ultra -low loss at GHz frequency
・ Guarantee correct measurements that are not affected by radiation electromagnetic fields
・ It is also possible to measure the electric field inside the animal organization, fruits or vegetables in the MRI system.
■ Target application
・ Evaluation of ratio absorption (SAR)
・ Medium -high voltage (HV) electrical components
·antenna
·plasma
・ Magnetic resonance imaging (MRI)
-
Product
EMF measurement solution in a harsh environment optical probe, optical world sensor eoProbe
-
Handling Company
Wave Crest
1 Models of EMF measurement solution in a harsh environment optical probe, optical world sensor eoProbe
| Product Image | Part Number | Price (excluding tax) |
|---|---|---|
|
|
Eoprobe |
Available upon quote |
Other products of Wave Crest
View more products of Wave Crest
