High -performance desktop XRF analysis device EPSILON series EPSILON 4
Spectory
About This Product
High -speed and accurate atline element analysis
Epsilon 4, designed based on the experience and success of the XRF splitometer of the proven EPSILON 3 series, is a multifunctional device that supports all industries that require elemental analysis from R & D to process management fields, from fluorine (F) to American (AM). The latest excitation/detection technology and the completed analysis software are fused and smartly designed Epsilon 4 analytical performance is comparable to powerful floor -placed XRF division.
■ Overview
・ Epsilon 4 without choosing a place
Epsilon 4 can be placed near the production line without worrying about the location because there are few structural requirements. With its high performance, it can be used for most applications under various environmental conditions, reducing helium and vacuum maintenance costs.
■ More than the analysis
Energy distributed fluorescent X -ray analysis performs elemental analysis from carbon (C) to American (AM), and can support the concentration range from sub -PPM to 100WT %.
Omnian can perform a standard dress analysis, abnormal identification (finger print) software, which is important for analysis speed, and in Stratos, you can perform a quick and simple non -destructive analysis of the coat, surface layer and multi -layered structure.
You can use Enhanced Data Security, which complies with regulations such as FDA 21 CFR Part 11. You can also use Oil-Trace to quantify the fuel and bio-fuel mixture in unused and used lubricating oils.
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Product
High -performance desktop XRF analysis device EPSILON series EPSILON 4
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Handling Company
Spectory
1 Models of High -performance desktop XRF analysis device EPSILON series EPSILON 4
| Product Image | Part Number | Price (excluding tax) | Detector | Sample handling | X -ray tube | software |
|---|---|---|---|---|---|---|
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EPSILON 4 |
Available upon quote |
High-resolution silicon lift detector (SDD) (usually 135 EV @ MN-Kα) Maximum count rate: 1,500,000 count/second (50%bad time) |
Removed 10 -position sample changer Dimrine meter can support samples up to 52 mm in diameter (2 inches) |
High stability due to metal ceramic side window High sensitivity for light elements (NA, MG, al, SI) 50 micrometers thin beryllium windows P, S, and CL analysis by the highest performance AG Anode X -ray tube |
OMNIAN Stander Dress analysis solution element screening Passed by FingerPrint solution/failed analysis |
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