Target sampling in microscopic regions is possible in a short time EM TXP-EM TXP

Target sampling in microscopic regions is possible in a short time EM TXP
Leica Microsystems Vertrieb GmbH

About This Product

A unique target cross -sectional device developed exclusively for cutting and polishing that meets a wide range of needs from optical microscope to electron microscope. Beginners are easy to enter, and veterans can make higher -grade samples.

■ Target sampling in the small area is possible in a short time
The accurate milling, cutting, and polishing work aimed at the specific part of the sample was a difficult and very time -consuming task that could easily lose targets. With Leica EMTXP, you can easily sample a small area in a short time in a short time.

■ Observation of the target during the work process using the entity microscope
The sample can be processed and observed at -30 ° to 60 ° for jigs by adjusting the pipot arm. At 60 ° angles, you can observe the sample cross section from the front. In addition, if you adjust the arm at the angle of -30 °, the sample can be placed at 90 ° for the observation lightway, and the sample top can be simply measured by the template in the eyepiece.

■ Main functions and features
･ Angle adjustment and approach to aim for a small target
･ Observation by high -performance entity microscope
･ Processing by multifunctional, semi -auto mechanical system
･ The polishing process of the cross section can be automatically controlled.

Model
There are 1 models for this product.

Product
Target sampling in microscopic regions is possible in a short time EM TXP

Handling Company
Leica Microsystems Vertrieb GmbH

*Please note that we may not be able to accommodate sample requests.

1 Models of Target sampling in microscopic regions is possible in a short time EM TXP

Product Image	Part Number	Price (excluding tax)
	EM TXP	Available upon quote