Semiconductor inspection microscope DM12000 m-DM12000 m

Semiconductor inspection microscope DM12000 m
Leica Microsystems Vertrieb GmbH

About This Product

The latest optical technology contributes to improving productivity

■ Observing diagonal lighting
Combining the diagonal irradiation function to the i-line UV lighting, the lighting is performed from a certain angle to the sample to achieve 3D super-resolution, enabling quick and efficient observation.

■ Ideal air flow by LED lighting
With a built -in LED lighting corresponding to all observation methods. It also contributes to space -saving and power saving, etc., as well as realizing an ideal air flow around the microscope.

■ Contrast Manager (DM8000 m/DM12000 m)
Easy to switch each observation method of clear view, dark view, differential interference, and UV with one button. You can switch the observation method without keeping an eye on the microscope, and you will be able to work comfortably.

■ Scan quickly to large parts up to 6 inches
Use a macro objective lens to observe a wide view of 35.7mm at once. With a view of 30 % larger than the conventional scanning objective lens, do not miss the defective part and the uneven film thickness.

Model
There are 1 models for this product.

Product
Semiconductor inspection microscope DM12000 m

Handling Company
Leica Microsystems Vertrieb GmbH

*Please note that we may not be able to accommodate sample requests.

1 Models of Semiconductor inspection microscope DM12000 m

Product Image	Part Number	Price (excluding tax)	UV diagonal lighting	stage
	DM12000 m	Available upon quote	can be	Manual inspection stage: 12 × 12 "Operation distance 302 × 302mm, scanning stage: 12 × 12” operation distance 302 × 302mm