Apollo Wave Co., Ltd.

■Features ・Standard model compatible with various wafer level measurements. - Manual prober compatible with wafer sizes up to ...

• Testing Equipment

• Probers

■Features - Compact prober ideal for chip-level IV/CV measurements. -Prober compatible with sample sizes up to 50mm. ・It is an...

• Testing Equipment

• Probers

■Features ・Model compatible with temperature characteristic evaluation from -60℃ to +350℃ and microcurrent measurement. -Manua...

• Testing Equipment

• Probers

■Features ・Small prober ideal for IV/CV measurements on up to 4-inch wafers. - Compact prober compatible with wafer sizes up t...

• Testing Equipment

• Probers

■Features ・Same shape as high frequency probe, can be attached to positioner ・LCR chip components can be mounted near the dev...

• Testing Equipment

• Spring Contact Probes

■Features ・Achieves excellent high frequency characteristics using a coaxial probe ・Excellent high frequency characteristics ...

• Testing Equipment

• Probe Cards

■Features ・Supports voltage application of 10kV or more and large current measurement of 200A or more ・Supports 10kV, 200A or...

• Testing Equipment

• Probe Cards

■Features ・Ideal for high temperature (200℃) and microcurrent measurements. - Compatible with Keysight Technologies 4,060, 4,0...

• Testing Equipment

• Probe Cards

This is an adapter for attaching various probe cards to the prober. ■Supported shapes ・For 4.5 inch square board ・For bulk c...

• Testing Equipment

• Probe Cards

■Features ・Supports up to about 300 pins ・Multi-take compatible ・Low price and reduced test costs ・Quick delivery

• Testing Equipment

• Probe Cards

■Features ・Ideal for low noise/low leak measurements ・Triaxial cable connector for measurement -Triaxial comes with a spec gu...

■Features ・Measurement at high temperatures and minute current measurement possible ・Low high temperature・-60～350℃ ・Microc...

• Testing Equipment

• Probe Cards

■Features ・Temperature characteristic evaluation from -60℃ to +350℃, micro current measurement. ・Supports power device measur...

• Testing Equipment

• Probers

■Features ・For automatic measurement of extremely low and high temperatures in vacuum and gas environments, organic devices, a...

• Testing Equipment

• Probers

■Features ・Chuck stage with temperature controllable heating and cooling. - Available in sizes ranging from 50mm, 4 inches to ...

• Heat Sources

• Plate Heaters

■Features ・Temperature characteristic evaluation at extremely low to ultra-high temperatures, vacuum environment, gas environm...

• Testing Equipment

• Probers

■Features ・Low cost・High performance ・Fixing method: Magnetic rubber type ・Stroke amount: X, Y, Z each ±5mm ・Straightness:...

• Controllers

• Positioners

■Features ・Achieve a large amount of movement with high precision ・Fixing method: Magnet with ON/OFF ・Stroke amount: X, Y, Z...

• Bio

• Micromanipulators

■Features ・Chuck stage with temperature controllable heating and cooling. - Available in sizes ranging from 50mm, 4 inches to ...

• Heat Sources

• Plate Heaters

■Features ・Compact body with high precision specifications ・Fixing method: Magnet with ON/OFF ・Stroke amount: X, Y, Z each ±...

• Bio

• Micromanipulators

Various probes that achieve specifications of 20kV or more and 200A or more. ■Compatible measuring instruments (HV) ・KEYSIGHT...

■Features ・Achieve reliable contact with high frequency probes ・Fixing method: Magnet type or screw fixation ・Stroke amount:...

• Bio

• Micromanipulators

■Features - Eliminate vibrations that affect probing. ・Lineup includes desk-integrated type and tabletop type ・Suggested acco...

• Protective Materials & Equipment

• Vibration Isolators

■Features ・Coaxial structure for measurement of several hundred MHz ・Connector: SMA

■Features ・Achieve fA level measurement ・Best selling probe ・Connector: Triaxial ・Cable: Triaxial ・Cable length: Any - Use...

■Features ・For connection with curve tracer. ・Soft contact with leaf spring. - Use by attaching a probe tip to the tip.

■Other equipment High temperature test fixture

■Features ・A test head that interfaces Keithley's S530, S540, etc. with a fully automatic prober. - Also compatible with high ...

■Tungsten (W) ·hard ・With spring properties ・For AI pads ・Tip diameter lineup: 1μm, 2μm, 5μm, 10μm, 30μm ・We also have tip ...

■Other equipment ・CV-BT measurement system ・This product is made to customer specifications.