Hokkai Photoelectronics Co., Ltd.

■TOF-e type work function measuring device Achieving electron time-of-flight measurement following TOF-MS ■Summary Acquisition...

• Sensors

• ToF Sensors

Photoelectron microscope MyPEEM ■Observe photoelectrons emitted from the sample surface ・Two-dimensional mapping of electronic...

• Observation Equipment

• Electron Microscopes

■Product overview Atom layers are built up one by one on the substrate inside the vacuum chamber by repeating the following cyc...

• Semiconductor Manufacturing

• ALD Systems