Defect inspection device ANALYZER5 Φ6
ANALYZER Co., Ltd.
About This Product
Approximate inner diameter that can be inspected: Φ7mm to Φ100mm
Inner diameter/roundness measurement function has been added to the cylindrical inner surface defect inspection function of the conventional ANALYZER3. Defect inspection and inner diameter/roundness measurement can be performed at the same time.
■Solving issues like these
・I want to eliminate variations in measured values by inspectors.
・I want to reduce the number of measurement steps required by inspectors.
・I want to perform inner diameter/roundness measurement at high speed.
・I want to integrate defect inspection process and diameter/roundness measurement process into one.
■Features
・Defect inspection and inner diameter/roundness measurement can be performed at the same time.
・High-speed measurement is achieved by combining 2D data and 3D data.
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Product
Defect inspection device ANALYZER5 Φ6
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Handling Company
ANALYZER Co., Ltd.
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Categories
1 Models of Defect inspection device ANALYZER5 Φ6
| Product Image | Part Number | Price (excluding tax) | Approximate inspection speed | Detected component | Effective measurement length | Laser class | Light source | Method | Minimum detection size | Number of revolutions | Power supply | Sampling frequency | Target caliber |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
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SG-HDRM5 |
Available upon quote | Approximately 4 seconds *When measuring length is 100mm and resolution is 0.1mm | Direct light | 200mm | Class 2~3B |
Red semiconductor laser (wavelength 635nm~670nm max. 40mW) Infrared semiconductor laser (wavelength 840nm~1300nm max. 40mW) |
Optical scanning method | 0.2mm | 15,000rpm | 100, 200V |
Defect inspection function: ~2,400kHz Diameter/roundness measurement function: ~200kHz |
Φ7mm~ |
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About Company Handling This Product
- Japan