Product
Inner diameter defect inspection device ANALYZER3 NEOHandling Company
ANALYZER Co., Ltd.Categories
Product Image | Part Number | Price (excluding tax) | Approximate inspection speed | Detected component | Effective measurement length | Laser class | Light source | Method | Minimum detection size | Number of revolutions | Power supply | Sampling frequency | Target caliber |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|
SG-LSDC-6-203-18K-NEO |
Available upon quote | Approximately 3.3 seconds *When measuring length is 100mm and resolution is 0.1mm | Direct light | 200mm | Class 3B | Red semiconductor laser (wavelength 640nm max. 40mW) | Optical scanning method | 0.2mm | 18,000rpm | 100, 200V | ~2,400kHz | Φ7mm~ |