Inner diameter defect inspection device ANALYZER3 NEO-SG-LSDC-6-203-18K-NEO
Inner diameter defect inspection device ANALYZER3 NEO-ANALYZER Co., Ltd.

Inner diameter defect inspection device ANALYZER3 NEO
ANALYZER Co., Ltd.


About This Product

Approximate inner diameter that can be inspected: Φ7mm to Φ30mm This is a top-of-the-line model with improved inspection speed and minimum detection size for inner diameter inspection of holes with a diameter of 7 mm or more. This is an inner diameter inspection device with improved inspection accuracy, inspection speed, durability, and robustness to meet mass production lines that require more severe conditions. ■Solving issues like these ・You can reduce labor costs. ・Quality is stable due to numerical standards. ・It is possible to prevent excessive NG products due to excessive quality. ・Operation efficiency can be improved by overwhelmingly shortening inspection time. ■Features - Scans the inner diameter of the workpiece at high speed and inspects for defects in a non-destructive/non-contact manner. ・The minimum detection size is 0.1 mm (twice as large as conventional models), making it suitable for inspecting minute defects. - Performs high-speed inspection at 18,000 rpm (1.2 times faster than conventional models).

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    Inner diameter defect inspection device ANALYZER3 NEO

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1 Models of Inner diameter defect inspection device ANALYZER3 NEO

Product Image Part Number Price (excluding tax) Approximate inspection speed Detected component Effective measurement length Laser class Light source Method Minimum detection size Number of revolutions Power supply Sampling frequency Target caliber
Inner diameter defect inspection device ANALYZER3 NEO-Part Number-SG-LSDC-6-203-18K-NEO

SG-LSDC-6-203-18K-NEO

Available upon quote Approximately 3.3 seconds *When measuring length is 100mm and resolution is 0.1mm Direct light 200mm Class 3B Red semiconductor laser (wavelength 640nm max. 40mW) Optical scanning method 0.2mm 18,000rpm 100, 200V ~2,400kHz Φ7mm~

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