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Scanning probe microscope (SPM) AFM-IR device AFM-IR PiFM Nanoscale infrared spectroscopic imaging device [light-induced force microscope]
Japan Laser Co., Ltd.
About This Product
■Features of AFM-IR PiFM nanoscale infrared spectroscopic imaging device [photoinduced force microscope]
・World's highest spatial resolution 10nm chemical imaging (regardless of sample type)
- Obtains information only from the outermost surface (signals from deeper parts are not detected)
・No need to section the sample, even block-shaped samples do not affect spatial resolution
・Equipped with high-speed hyPIR™ imaging function that acquires spectra at every pixel
・No background noise because dipole force is detected
■Cutting-edge nanoscale infrared spectroscopy equipment using AFM-IR / PiFM (Photo-induced force microscope)
This is currently the most advanced nanoscale infrared spectrometer that uses next-generation AFM-IR technology, PiFM (Photo-induced force microscope), and enables chemical imaging with the world's highest spatial resolution of 10 nm. is. Laser light is irradiated onto the sample and the tip of the AFM tip, and the response of the sample to the laser light (dipole force) is detected using the AFM cantilever.
It operates in non-contact mode, so there is no contact to the sample. In addition, high-speed spectrum acquisition (0.1 seconds per point) is possible. Taking advantage of this feature, the hyPIR™ imaging mode, which acquires spectra from every pixel in the field of view, is extremely useful for analyzing unknown samples.
■Measurement principle of AFM-IR / PiFM photo-induced force microscope
PiFM is a measurement method that combines AFM and laser light. When a sample and AFM tip are irradiated with laser light of a specific wavelength, there are certain materials that specifically respond to (induce) that wavelength of light. By bringing the induced material and the induced AFM tip into close proximity, material interactions are detected.
The force region between the polymer sample and the AFM tip is extremely narrow (<10 nm), allowing high-resolution chemical images (spatial resolution <10 nm) and high-resolution spectra (resolution <1 cm-1) to be obtained. By detecting this induced force with AFM, it is possible to observe not only AFM images but also chemical imaging at the nano-level with high accuracy and resolution.
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Product
Scanning probe microscope (SPM) AFM-IR device AFM-IR PiFM Nanoscale infrared spectroscopic imaging device [light-induced force microscope]
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Handling Company
Japan Laser Co., Ltd.
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Categories
1 Models of Scanning probe microscope (SPM) AFM-IR device AFM-IR PiFM Nanoscale infrared spectroscopic imaging device [light-induced force microscope]
| Product Image | Part Number | Price (excluding tax) |
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Light-induced force microscope |
Available upon quote |
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About Company Handling This Product
- Japan