Scanning probe microscope (SPM) AFM-IR device Vista One IR +s-SNOM, IR-PiFM / PiF-IR
Japan Laser Co., Ltd.
About This Product
■AFM Vista One features for PiFM
This is the most advanced AFM-IR device that overcomes the shortcomings of conventional AFM-IR by adopting the PiFM method. It is used in various applications such as semiconductors, polymers, inorganic materials, and nanophotonics.
■Sub-10nm PiF IR spectroscopy
・Using broadband tunable lasers for nanoscale IR experiments.
・Spectral resolution 1cm-1.
・Surface sensitivity at monomolecular layer level
■Sub-10nm PiFM chemical mapping
・Surface sensitivity at monomolecular layer level
- Compatible with both organic and inorganic materials.
■Achieving the installation of an appropriate optical system
Designed to work with any light source. A 3D-driven parabolic mirror focuses the excitation light onto the side of the chip, regardless of the wavelength of the light used.
■High-speed cantilever alignment
The instrument's on-board cantilever alignment chip maintains optical alignment of both the AFM feedback and near-field lasers even when cantilevers are replaced. The Vista One head can be removed to replace samples or tips without losing optical alignment.
■Can be measured in a short time
・PiF IR spectrum can be swept at the fastest time of 100 ms/1 point.
-Identify materials using existing FTIR spectra.
・Fixed wavelength PiFM images (chemical mapping) can be acquired in a few minutes over a range of up to 80 µm in the X and Y directions.
・Optical alignment is maintained even when samples are exchanged.
hyPIR™ imaging and our automated principal component analysis tools provide complete image and spectral data sets with minimal effort.
■Designed with emphasis on accuracy Capacitive sensor + optical encoder
The movement range of the motorized stage installed in the device is 6mm. Equipped with optical encoder for precision control. The AFM scanner's capacitive sensor provides linear scanning with ~100pm RMS accuracy.
■Dual Z scan mechanism
Speed up image sampling without introducing artifacts. The instrument's dual Z piezo scanner system provides accurate scanning with a large vertical range of 12 µm.
-
Product
Scanning probe microscope (SPM) AFM-IR device Vista One IR +s-SNOM, IR-PiFM / PiF-IR
-
Handling Company
Japan Laser Co., Ltd.
-
Categories
1 Models of Scanning probe microscope (SPM) AFM-IR device Vista One IR +s-SNOM, IR-PiFM / PiF-IR
| Product Image | Part Number | Price (excluding tax) | Multiplexer | Options you need |
|---|---|---|---|---|
|
|
Vista One IR +s-SNOM |
Available upon quote | Large | S-SNOM module |
Customers who viewed this product also viewed
Other products of Japan Laser Co., Ltd.
View more products of Japan Laser Co., Ltd.
About Company Handling This Product
- Japan