Scanning probe microscope (SPM) AFM-IR device Vista 75 IR +s-SNOM, IR-PiFM / PiF-IR-Vista 75 IR +s-SNOM
Scanning probe microscope (SPM) AFM-IR device Vista 75 IR +s-SNOM, IR-PiFM / PiF-IR-Japan Laser Co., Ltd.

Scanning probe microscope (SPM) AFM-IR device Vista 75 IR +s-SNOM, IR-PiFM / PiF-IR
Japan Laser Co., Ltd.


About This Product

Next-generation PiFM/PiF-IR equipment using photo-induced force.AFM-IR equipment that can be used in a variety of applications for semiconductors, nanophotonics, polymers, inorganic materials, etc. ■Features of AFM-IR device Vista75 This is the most advanced AFM-IR device that overcomes the shortcomings of conventional AFM-IR by adopting the PiFM method. It is used in various applications such as semiconductors, polymers, inorganics, and nanophotonics. ■Compact footprint Vista 75 has a more compact design that occupies more than 60% of the space compared to the previous Vista One. ■Easy access to samples Easy sample access and one-handed AFM head clamp simplifies tip and sample exchange. The lightweight removable housing and open design make optical alignment easy. ■Suitable for larger samples The stage travel range is now 75mm, greatly reducing sample size limitations. ■Quick change and easy switching of optical system Pre-calibrated optics allow easy switching between PiFM (PiF-IR), sSNOM, and Raman. Equipped with a robust laser. A 3D-driven parabolic mirror aligns the excitation laser to the apex of the AFM tip for all types of tip-enhanced measurements, including PiFM, PiF-IR, s-SNOM, and tip-enhanced Raman. ■Self-contained system No special environment is required. The Vista 75 comes complete with vibration isolation and a temperature-controlled acoustic enclosure with dry air.

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    Scanning probe microscope (SPM) AFM-IR device Vista 75 IR +s-SNOM, IR-PiFM / PiF-IR

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1 Models of Scanning probe microscope (SPM) AFM-IR device Vista 75 IR +s-SNOM, IR-PiFM / PiF-IR

Product Image Part Number Price (excluding tax) Multiplexer Options you need
Scanning probe microscope (SPM) AFM-IR device Vista 75 IR +s-SNOM, IR-PiFM / PiF-IR-Part Number-Vista 75 IR +s-SNOM

Vista 75 IR +s-SNOM

Available upon quote Large S-SNOM module (with Michelson interferometer to measure both near-field amplitude and phase)

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