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Scanning transmission electron microscope [TENSOR]-TENSOR
Scanning transmission electron microscope [TENSOR]-Toyo Technica Co., Ltd.

Scanning transmission electron microscope [TENSOR]
Toyo Technica Co., Ltd.

Toyo Technica Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

5.0hours

Very Fast Response


About This Product

■Summary

Specialized in 4D-STEM measurement that can record electron diffraction patterns at each pixel at high speed

■Features

・Diffraction imaging using a direct detection hybrid pixel camera ・High-speed EDS map acquisition using two windless EDS detectors (solid angle 2sr) ・Equipped with high-speed electron beam precession function as standard (maximum precession rate: 72kHz) ・Integrated electrostatic beam blanking function ・Sample vacuum environment close to UHV (10-6Pa order) ・Analyze, process, and visualize 4D-STEM data at near real-time speeds

■Measurement method

・STEM BF/ADF/HAADF imaging ・STEM lattice imaging ・Composition analysis and mapping using EDS ・Azimuth/phase mapping ・Distortion mapping ・Virtual STEM imaging ・STEM/EDS tomography ・Electron beam diffraction tomography

  • Product

    Scanning transmission electron microscope [TENSOR]

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1 Models of Scanning transmission electron microscope [TENSOR]

Image Part Number Price (excluding tax)
Scanning transmission electron microscope [TENSOR]-Part Number-TENSOR

TENSOR

Available upon quote

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About Company Handling This Product

Response Rate

100.0%


Response Time

5.0hrs

  • Japan

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